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Description / Abstract:
Non-IC Component Evaluations This document describes
manufacturing process simulations for use with applicable component
specifications to assure that electronic components can meet
expected reliability requirements after exposure to assembly
factory processes. It is not intended as an assembly production
specification or a stand-alone qualification document. The
procedure consists of a set of assembly process simulations that
can be performed by either the component user or manufacturer prior
to reliability testing as specified in the applicable component
qualification and reliability monitoring documents. The simulations
include alternative conditions depending on the component type,
physical characteristics and anticipated use. The levels defined
can be used for describing either expected performance
characteristics by the manufacturer or the required characteristics
for the users assembly process. It is expected that a single
component would be evaluated for a subset of the alternative
conditions. For example, large connectors might be qualified
utilizing the lower of two reflow temperature ranges while smaller
packages, which typically become much hotter during infrared or
convection reflow, might be qualified for the higher range.
Similarly, components with physical characteristics that prohibit
total immersion cleaning would not be evaluated for this type of
cleaning process. Unless otherwise specified, this document applies
to both surface-mount (SM) reflowed components and throughhole (TH)
components, which are wave soldered or reflowed. For wave solder of
SM components, user and supplier should work together to identify
appropriate procedures.