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IPC-9261
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IPC-9261 Revision A, October 1, 2006 In-Process DPMO and Estimated Yield for PCAs
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Description / Abstract:
This document defines standard methodologies for calculating
defects per million opportunities (DPMO) metrics related to
electronic printed board assembly processes. It is intended for use
in measuring in-process assembly steps rather than end product
determination. Calculation of completed item DPMO is addressed in
IPC-7912.
Additionally, a guide to defect categorization is provided that when used withJ-STD-001 and IPC-A-610 can serve as a base for summarizing and reporting in-process defects.
Note: This document does not dictate the number of assemblies or data points needed to calculate DPMO metrics.
Additionally, a guide to defect categorization is provided that when used withJ-STD-001 and IPC-A-610 can serve as a base for summarizing and reporting in-process defects.
Note: This document does not dictate the number of assemblies or data points needed to calculate DPMO metrics.